Cameca

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Secondary Ion Mass Spectrometry consists of analyzing secondary ions with a mass spectrometer. Secondary ion emission by a solid surface under ion bombardment supplies information about the elemental, isotopic and molecular composition of its uppermost atomic layers. The SIMS technique provides a unique combination of extremely high sensitivity (up to ppt in element imaging) for all elements from Hydrogen to Uranium and above, high lateral resolution imaging (40nm), and a very low background that allows high dynamic range. SIMS is applied on material science ranging from geology, material science, mineralogy, nuclear particle analysis, stable isotope, life science (microbiology, cell biology, biogeochemistry), and metrology.

Cameca Products

Low Energy Electron Induces X-Ray Emission Spectrometry (LEXES

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3D Atomic Probe Tomography (APT)

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Secondary Ion Mass Spectrometry (SIMS)

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Electron Probe Micro Analyzer (EPMA)

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