Taking a Closer Look with the Hitachi TM4000 II & TM4000Plus II

Amidst industrial and research demands for ever-greater detail, accuracy, and speed, imaging capabilities have evolved beyond merely producing images. Modern laboratories require imaging systems that deliver sharp results, offer ease of operation, and provide the flexibility to handle a wide variety of sample types.

The challenge intensifies when dealing with samples possessing diverse characteristics. While conductive samples may be relatively straightforward to observe, the same cannot always be said for non-conductive materials or hydrated samples. This is where the Scanning Electron Microscope (SEM) plays a crucial role.

SEM enables users to obtain highly detailed and sharp images of sample surfaces. Beyond its use in clinical and research laboratories, SEM technology is vital to numerous industrial applications, ranging from material characterization to surface analysis. Yet, advanced technology need not equate to complex operation.

When SEM Technology Becomes Simpler

Recognizing these needs, PT Fajar Mas Murni (FMM) introduces the Hitachi TM4000 II and TM4000Plus II, the latest generation of Hitachi’s Tabletop Microscope (TM) series. Designed to maintain a compact and practical format, the TM4000 series integrates ease of operation, optimal imaging, and high image quality into a single tabletop microscope platform. This approach ensures that users do not have to choose between image quality and ease of use.

The Hitachi TM4000 II and TM4000Plus II combine both in a single imaging solution

Producing High-Quality Images with a Simpler Process

         One of the key advantages of the TM4000 series is how advanced technology is integrated into an intuitive workflow.

1. Automation for Observation and Elemental Analysis; Various observation and analysis processes can be performed using simplified steps. Users can easily navigate and manage images, seeing process more efficient.
2. More Intuitive Observation Area Navigation; With Camera Navi, users can utilize optical images to locate and navigate to the specific sample areas they wish to observe. Furthermore, acquired SEM images can be overlaid onto the SEM MAP, helping users pinpoint observation locations more easily.

Observing Non-Conductive Samples Without Complex Processing

One of the challenges in SEM observation lies in sample characteristics. Not all samples are conductive; under certain conditions, non-conductive or hydrated samples can present specific challenges during the imaging process.

The TM4000Plus II is designed to provide greater flexibility

Under low-vacuum conditions, users can observe a wide range of materials including non-conductive samples like ink toner particles and hydrated leaf surfaces without the need for complex sample preparation. A "charge reduction mode" also enables the reduction of sample charging with just a single click. Consequently, a greater variety of samples can be examined using a simplified workflow.

Surface details are preserved under low-vacuum conditions

The TM4000Plus II is equipped with an innovative secondary electron detector that enables users to obtain surface details of non-conductive samples under lower vacuum conditions. One such feature is Hitachi's Ultra Variable-pressure Detector (UVD). The UVD generates secondary electron images by detecting visible light excited through the interaction of electrons with gas. This technology helps provide more detailed surface information while expanding observation capabilities in low-vacuum conditions.

Supports acceleration voltages up to 20 kV

For further analysis needs, the TM4000Plus II also offers an accelerating voltage of up to 20 kV. This high accelerating voltage enables faster EDS analysis; for instance, EDS mapping data at 20 kV can be acquired in approximately two minutes, supporting users who require elemental information more efficiently.

Need Higher Resolution? There's Multi Zigzag

For high-magnification imaging needs, a "Multi Zigzag" feature is available as an option. This function captures multiple images at high magnification and stitches them together into a single, high-resolution image. This allows users to obtain a representation of a wider observation area while maintaining the necessary level of image detail.

For Thin and Biological Samples

Research requirements do not always stop at surface observation. For applications requiring the examination of thin samples, the STEM holder option enables users to obtain transmission images by utilizing the Hitachi UVD. This feature opens up possibilities for observing both thin and biological samples, thereby expanding the versatility of the TM4000Plus II for a wide range of research and laboratory needs.

One Platform, Diverse Imaging Needs 

From material characterization to biological samples, and from surface observation to elemental analysis, the Hitachi TM4000 II and TM4000Plus II offer a more practical approach to modern imaging needs. It is not merely about obtaining more detailed images; it is about how imaging technology can help users work more easily, observe a wider range of samples, and acquire necessary information more efficiently. And when this technology comes in a compact tabletop design, the SEM becomes more readily accessible to meet the demands of the modern laboratory.

Hitachi TM4000 II & TM4000Plus II. Compact in design. Powerful in observation.

For further information regarding the Hitachi Tabletop Microscope TM4000 II and TM4000Plus II—including configuration options and applications please contact PT Fajar Mas Murni (FMM). FMM delivers laboratory technology and industrial solutions, while providing the necessary support to ensure these technologies perform optimally for customers.