Laboratory and Inspection Equipment - NanoScience Research

Laboratory and Inspection Equipment

Our Services

PT Fajar Mas Murni offers a comprehensive range of equipments from basic laboratory, Anatomy Pathology and Cytology, Nanoscience research microscopy & microanalysis, stem cell and IVF research. The product portfolio is supplemented by innovative equipment and the latest technologies, which make it easier for users to work at all levels. We provide superb service, support, and applications assistance.

NanoScience Research

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At Nanoscience/Nanomaterial field, PT FAJAR MAS MURNI work with our customers to provide the best solution for a particular problem. Our nanoscience Instruments provide sophisticated yet intuitive instrumentation for micro to nanoscale imaging and materials characterization. We provide superb service, support, and applications assistance.

NanoScience Research Products

Transmission Electron Microscope (TEM)

Field Emission Transmission Electron Microscope HF5000
Field Emission Transmission Electron Microscope HF5000

Transmission Electron Microscope HT7800 Series
Transmission Electron Microscope HT7800 Series


Focused Ion & Electron Beam (FIB)

Focused Ion and Electron Beam System Ethox NX5000 Series
Focused Ion and Electron Beam System Ethox NX5000 Series

Real-time 3D analystical FIB-SEM NX9000
Real-time 3D analystical FIB-SEM NX9000


Scanning Electron Microscope (SEM)

Hitachi FlexSEM1000 II
Hitachi FlexSEM1000 II

Hitachi TM4000Plus II
Hitachi TM4000Plus II

Field Emission Scanning Electron Microscopes (FE-SEM)
Field Emission Scanning Electron Microscopes (FE-SEM)

Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM)

Hitachi TM4000 II
Hitachi TM4000 II

SEM SU3800
SEM SU3800

SEM SU3900
SEM SU3900

Schottky Field Emission Scanning Electron Microscope SU5000
Schottky Field Emission Scanning Electron Microscope SU5000

Ultra high resolution cold field emission SEM SU8600
Ultra high resolution cold field emission SEM SU8600

Ultra High Resolution Schottky SEM SU7000
Ultra High Resolution Schottky SEM SU7000


Atomic Force Microscope (AFM)

Atomic Force Microscopes (AFM5500M)
Atomic Force Microscopes (AFM5500M)

Environment Control Unit AFM5300E
Environment Control Unit AFM5300E

Multifunction Probe Microcopy Platform AFM100
Multifunction Probe Microcopy Platform AFM100


Specimen Preparation Equipment

Ion Milling System IM4000Plus
Ion Milling System IM4000Plus

MC1000 ION Sputter Coater
MC1000 ION Sputter Coater

ZONETEM II
ZONETEM II

Sample Cleaner ZONESEMⅡ
Sample Cleaner ZONESEMⅡ

Ion Milling System ArBlade 5000
Ion Milling System ArBlade 5000