Our Principals
Innovative Scanning Probe Microscopy (SPM) products offering extraordinary levels of performance, value, and ease-of-use for a wide range of application from surface topography to a wide variety of nanoscale surface property measurements. The new technology AFM offer significantly improved sensitivity, accuracy, and resolution for wide range of capabilities, and extraordinary performance.
Atomic Force Microscope (AFM) Types
Multifunction Probe Microcopy Platform AFM100
Environment Control Unit AFM5300E
Atomic Force Microscopes (AFM5500M)
