Leica DM1750 M
Product Description
With a focus on tasks in the material lab or research
The new Leica DM1750 M is a material microscope designed for rapid, accurate analysis results even for a use in rough ambient conditions.
Working with the Leica DM1750 M you will see, how simple and reliable microscopy can be. Its robust design contains an excellent optical system and allows the inspection even of larger samples, in brightfield, oblique- or with polarized light. The entire reflected light illumination is carried out with Power-LEDs which allow an inspection with different illumination angles, especially suitable for the detection of micro scratches or for gaining height information.
Specification
| General Characteristic | |
|---|---|
| Applications | Industry and Manufacture |
| Stand type | Materials analysis microscope in upright configuration for larger samples. With integrated protection and ergonomic features |
| Contrast methods | Brightfield (RL BF), POL (RL POL), oblique illumination, differential interference contrast (RL DIC) |
| Objective nosepiece | 6× BF M25 or 7× BF M25 |
| Tubes | Binocular tube 30° or 45° w/wo integrated eyepieces – Trinocular camera tube 30° or 45° w/wo integrated eyepieces – Upright image binocular/trinocular tube – 10x/20 FOV fixed eyepieces, 10x/20 FOV focusing eyepieces, 10x/22 FOV focusing eyepieces |
| Objective turret / objectives | HI PLAN EPI objectives 5x, 10x, 20x. N PLAN EPI objectives 2.5x–100x. PLAN Fluotar objectives 1.25x–100x |
| Scope Unit | |
| Illumination | High-power LEDs with additional integrated segmented lighting for oblique illumination. 25,000 hour service lifetime, no lamp replacement, integrated aperture diaphragm for contrast control, continuously adjustable intensity without change to the color im |
Resources
| 08-Brosur Leica DM750 M-1750 M.pdf |
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