Scanning Electron Microscope (SEM)

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Hitachi SEM designed with an innovative electron source and detectors give superior imaging and analytical performance. High brightness at low accelerating voltages and the ultra variable-pressure detector are optimized for imaging surface at low pressures. The various SEM available for sure to be the workhorse in any laboratory.

Scanning Electron Microscope (SEM) Types

Ultra High Resolution Schottky SEM SU7000

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Ultra high resolution cold field emission SEM SU8600

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Schottky Field Emission Scanning Electron Microscope SU5000

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SEM SU3900

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SEM SU3800

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Hitachi TM4000 II

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Hitachi TM4000Plus II

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Hitachi FlexSEM1000 II

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